Mocking the Embedded World: Test-Driven Development, Continuous Integration, and Design Patterns by Michael Karlesky, Greg Williams, William Bereza, Matt Fletcher (Methods & Tools, Summer 2007).
- A description of how Atomic Object accomplishes Test Driven Development and Continuous Integration when developing embedded firmware.
- Includes "a full C-based sample project (using an Atmel AT91SAM7X ARM7) ... example [that] demonstrates transforming requirements into test code; system, integration, and unit tests driving development; daily "micro design" fleshing out a system’s architecture; the use of [Model Conductor Hardware] itself; and the introduction of mock functions to automated unit tests."